Software testing is the perfect candidate among software engineering activities for the union of academic and industrial minds. The workshop Testing: Academia-Industry Collaboration, Practice and Research Techniques (TAIC PART) is a unique event that provides a stimulating platform that facilitates collaboration between industry and academia on challenging and exciting problems of real-world software testing. The workshop brings together practitioners and academic researchers in a friendly environment with the goal to transfer knowledge, exchanging experiences, and enrich the understanding of the opportunities and challenges in the collaboration between the two sides.

TAIC PART 2016 is the eleventh edition in a series of highly successful events. Take a look at previous events and discover what happened at TAIC PART in the past years by following the links below. This year, TAIC PART will be co-located with the IEEE International Conference on Software Testing, Verification and Validation (ICST 2016) in Chicago, IL, USA. Please consider submitting a paper and/or registering to attend TAIC PART so that you can be part of a premier software testing conference.

Important Dates

ICST conference date & location:
April 11, 2016, Chicago, IL, USA co-located with ICST 2016 (April 10-15, 2016)

Call for Papers

Download the Call for Papers as PDF / Text

Theme and Goals

TAIC PART is a workshop that aims to forge collaboration between industry and academia on the challenging and exciting problem of real-world software testing. It is promoted by representatives of both industry and academia, bringing together industrial software engineers and testers with researchers working on theory and practice of software testing. TAIC PART expects submissions relevant to practice and research like evaluation of testing approaches by means of industrial surveys, case studies or experiments, experience reports on the application of scientific approaches in industry, or ideas on how to facilitate the knowledge transfer between industry and academia. The goals of TAIC PART range from the articulation of research questions in the field of software testing and analysis to practical challenges faced in industry. The common theme is the discussion and advancement of approaches and methods for sustainable collaboration between academia and industry in software testing.

Topics of Interest

TAIC PART 2016 invites papers on software testing, verification and validation of the following types:
  • Industry experience reports - practical and generalizable insights into how to apply and extend existing approaches to software testing and analysis
  • Research methods for collaborative research - ways that industry and academia can collaborate to further knowledge on testing, verification and validation
  • Industrial challenges with real-world testing - describe a real-world software testing problem for which industry seeks help from academia or vice versa
  • Knowledge exchange between industry and academia - how can new results and knowledge be exchanged between the two partners.

Submission and Proceedings

We invite submissions of the following types:
  • Regular Papers (6 pages): Experience reports, research methods, longer challenge papers (optional up to 10 pages on request)
  • Fast Abstracts (up to 2 pages): Challenges in practice and research, work in progress, positions statements
Regular papers will be evaluated with respect to the real-world significance of the described testing experience as well as their ability to forge partnerships and ultimately yield successful solutions. Fast Abstract papers are short papers that describe late breaking results, works in progress or real-world challenges and will be evaluated according to their ability to generate discussion and suggest interesting areas for future research. Authors should submit a PDF version of their paper through the TAIC PART 2016 paper submission site: Papers must be written in English and conform to the two-column IEEE template for conference proceedings. Please refer to the submission page for more details on formatting guidelines. All papers will undergo a rigorous review by at least three members of the program committee. All accepted papers will be part of the ICST joint workshop proceedings published in the IEEE Digital Library.

Best Paper Award

Win an iPad! The best paper presented at TAIC PART 2016 wins an iPad Air 2 kindly sponsored by Tricentis - The Continuous Testing Company. The best paper will be selected from the submitted regular papers based on the reviews by the program committee.

Sponsor of the TAIC PART 2016 Best Paper Award


Date and Time: April 11, 2016

Location: Chicago, IL, USA


Available soon.


General Chair

Rudolf Ramler

Software Competence Center Hagenberg, Austria

Program Co-Chair

Michael Felderer

University of Innsbruck, Austria

Program Co-Chair

Takashi Kitamura

Nat. Inst. of Advanced Industrial Science and Technology (AIST), Japan

Local Chair

Darko Marinov

University of Illinois at Urbana-Champaign, USA

Program Committee

  • Pekka Aho, VTT, Finland
  • Cyrille Artho, National Institute of Advanced Industrial Science and Technology, Japan
  • Jeff Ayars, Groupon, USA
  • Sigrid Eldh, Ericsson AB, Sweden
  • Emelie Engström, Lund University, Sweden
  • Vladimir Entin, OMICRON electronics, Austria
  • Robby Findler, Northwestern University, USA
  • Elizabeta Fourneret, University of Franche-Comté, France
  • Vahid Garousi, Hacettepe University, Turkey
  • Mark Harman, University College London, United Kingdom
  • Sam King, Twitter Inc., USA
  • Bogdan Korel, Illinois Institute of Technology, USA

  • Johann Krautlager, Airbus Helicopters, Germany
  • Shan Lu, University of Chicago, USA
  • Mika Mäntylä, University of Oulu, Finland
  • Stefan Mohacsi, Atos, Austria
  • Shin Nakajima, National Institute of Informatics, Japan
  • Reinhold Plösch, Johannes Kepler University Linz, Austria
  • Mukul Prasad, Fujitsu, USA
  • Ina Schieferdecker, Fraunhofer FOKUS, Germany
  • Per Runeson, Lund University, Sweden
  • Haruto Tanno, NTT, Japan
  • Guilherme Horta Travassos, Federal University of Rio de Janeiro, Brazil
  • Tatsuhiro Tsuchiya, Osaka University, Japan
  • Peter Zimmerer, Siemens Corporate Technology, Germany

Past Events

2015 | 2014 | 2013 | 2012 | 2011 | 2010 | 2009 | 2008 | 2007 | 2006